TBD prediction from measurements at low field and room temperature using a new estimator

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2000, Pages 218-219

  Ghetti, Andrea ^a   Bude, Jeff ^a   Weber, Gary ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CORRELATION METHODS; ELECTRIC BREAKDOWN OF SOLIDS;

TUNNELING INTO INTERFACE STATES (TEDIT);

SEMICONDUCTOR DEVICE TESTING;

EID: 0033716148     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)