Defects, grain size and electrical property in the non-stoichiometric BaTiO3 ceramics

Crystal Research and Technology

Volumn 35, Issue 5, 2000, Pages 609-614

  Tang, C Q ^a   Yao, S ^b  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CRYSTAL DEFECTS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC RESISTANCE MEASUREMENT; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY;

NON STOICHIOMETRY; POSITRON ANNIHILATION;

CERAMIC MATERIALS;

EID: 0033716042     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4079(200005)35:5<609::AID-CRAT609>3.0.CO;2-U     Document Type: Article

References (21)

1. COCKROFT, N.J., LEE, S. H., WRIGHT, J.C.: Phys.Rev.B44 (1991) 4117
2. DANIELS, J., HARDTL, K.H.: Philips Res. Rep. 31 (1976) 489
3. HAANSTRA, H.B., IHRIG, H.: J.Am.Ceram.So. 63 (1980).288
4. IHRIG, H.: phys.stat.sol. (a)47(1978)437
5. KLEIN, M.B., SCHWARTZ, R.N.: J.Opt.Soc.Am.B3 (1986) 293
6. KUTTY, T.R.N., MURUGARAJ, P., GAJBHIGE, N.S.: Mat.Res.Bull. 20 (1985) 565
7. LEWIS, G. V., CATLOW, C.R.A.: Radiat.Eff. 73 (1983) 307
8. LIN, T.F., HU, C.T., LIN, I.N.: J.Am.Ceram.Soc. 73 (1990) 531
9. POSSENRIEDE, E., JACOBS, P., SCHIRMER, O.F.: J.Phys.:Condens. Matter 4 (1992) 4719
10. RASE, D.E., ROY, R.: J.Amer.Ceram.Soc. 38 (1955a) 102
11. RASE, D.E., ROY, R.: J.Amer.Ceram.Soc. 38 (1955b) 389
12. RUDDLESDEN, S.N., POPPER, P.: Acta Crystallogr 11(1958)54
13. RYTZ, D., WECHSLER, B.A., GARRETT, M.H., NELSON, C.C., SCHWARTZ,.N.: J.Opt.Soc.Am. B7 (1990) 2245
14. SCHWARTZ, R.N., WECHSLER, B.A., RYTZ, D.: J.Am.Ceram.Soc. 73 (1990) 3200
15. SCHWARTZ, R.N., WECHSLER, B.A., MCFARLANE, R.M.: Phys.Rev.B46 (1992) 3263
16. SCHWARTZ, R.N., WECHSLER, B.A.: Phys.Rev.B48 (1993) 7057
17. TANG, C.Q.: Phys. Rev.B50 (1994a) 9774
18. TANG, C.Q.: Cryst. Res. Technol. 29 (1994b) 865
19. TANG, C.Q., ZHANG, D.M., XUE, Q.Z.: Cryst.Res.Technol.30 (1995) 837
20. TSUDA, N., SHIRASAKI, S., AKAHANE, T., TROEV, T., CHIBA, T.: J.Phys.Soc.Japan 44 (1978) 914
21. WERNICKE, R.: Philips Res. Rep. 31 (1976) 526