Simulation of multiple-bit soft errors induced by cosmic ray neutrons in DRAMs

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 2000, Pages 265-268

  Tosaka, Y ^a   Satoh, S ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; ERROR CORRECTION; NEUTRONS;

SOFT ERRORS (SE);

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0033715804     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)