NEXAFS and XPS characterization of molecular oxygen adsorbed on Ni(100) at 80 K

Surface Science

Volumn 459, Issue 1, 2000, Pages

  Kim, C M ^a   Jeong, H S ^a   Kim, E H ^a  

^a Kyungpook National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ADSORPTION; CHEMICAL BONDS; CHEMISORPTION; ELECTRON DIFFRACTION; MOLECULAR STRUCTURE; OXYGEN; X RAY PHOTOELECTRON SPECTROSCOPY;

NEAR EDGE EXTENDED X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); THERMAL DESORPTION SPECTROSCOPY (TDS);

NICKEL;

EID: 0033715564     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00512-4     Document Type: Article

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