Controllable LFSR for BIST

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2000, Pages 223-228

  Kay, Douglas ^a   Mourad, Samiha ^a  

^a CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; ELECTRIC FAULT CURRENTS; RANDOM PROCESSES;

TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0033715561     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)