Measuring mixed signal substrate coupling

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2000, Pages 855-859

  Rolain, Yves ^a   Van Moer, Wendy ^a   Vandersteen, Gerd ^a   van Heijningen, Marc ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYZERS; HYBRID INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; SENSORS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS;

SUBSTRATE COUPLING;

INTEGRATED CIRCUIT TESTING;

EID: 0033715373     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)