Surface strain characterisation using time-division-multiplexed 3D shearography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4101, Issue , 2000, Pages

  James, Stephen W ^a   Groves, Roger M ^a   Tatam, Ralph P ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; IMAGE PROCESSING; NONDESTRUCTIVE EXAMINATION; PERSONAL COMPUTERS; SEMICONDUCTOR LASERS; SHEAR DEFORMATION; STRAIN MEASUREMENT; SURFACE MEASUREMENT; SYNCHRONIZATION; TIME DIVISION MULTIPLEXING;

IMAGE ACQUISITION; INJECTION CURRENT MODULATION; SHEARING INTERFEROMETER; SHEAROGRAPHY; SURFACE STRAIN;

INTERFEROMETERS;

EID: 0033714342     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)