Intercomparison of resistance standards with calculable frequency dependence for the characterization of quantum Hall devices

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2000, Pages 176-177

  Melcher, J ^a   Bohacek, J ^a   Riha, J ^a   von Campenhausen, A ^a   Pesel, E ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; HALL EFFECT DEVICES; QUANTUM ELECTRONICS; RESISTORS;

FREQUENCY DEPENDENCE; QUANTUM HALL DEVICES;

ELECTRIC RESISTANCE;

EID: 0033714054     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)