Characterization of an EMC test-chip

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2000, Pages 117-123

  van Wershoven, Loes ^a  

^a Systems Lab Eindhoven   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC COMPATIBILITY; INTEGRATED CIRCUITS;

OUTPUT DRIVERS; TEST CHIPS;

MICROPROCESSOR CHIPS;

EID: 0033714029     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)