Quantifying decoupling capacitor location

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2000, Pages 761-766

  Fan, Jun ^a   Knighten, James L ^a   Orlandi, Antonio ^a   Smith, Norman W ^a   Drewniak, James L ^a  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED CIRCUITS; DC MACHINERY; INDUCTANCE MEASUREMENT; INTEGRAL EQUATIONS; INTEGRATED CIRCUITS; LOCATION; SURFACE MOUNT TECHNOLOGY;

DECOUPLING CAPACITORS LOCATION; MUTUAL INDUCTANCE;

CAPACITORS;

EID: 0033714025     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)