Embedded PowerPCTM SOC for test and measurement applications

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 2000, Pages 204-208

  Blaner, B ^a   Czenkusch, D ^a   Devins, R ^a   Stever, S ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; INTERFACES (COMPUTER); MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE;

DESIGN VERIFICATION; INTERCONNECTION FLEXIBILITY; SYSTEM ON CHIP (SOC);

EMBEDDED SYSTEMS;

EID: 0033713343     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)