Use of impedance spectroscopy in damage detection in tetragonal zirconia polycrystals (TZP)

Ceramics International

Volumn 26, Issue 7, 2000, Pages 745-751

  Tiefenbach, Andy ^a   Wagner, Susanne ^a   Oberacker, Rainer ^a   Hoffmann, Bernd ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPUTER SIMULATION; CRACK INITIATION; CRYSTAL DEFECTS; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS;

TETRAGONAL ZIRCONIA POLYCRYSTALS;

ZIRCONIA;

EID: 0033712382     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0272-8842(00)00014-6     Document Type: Article

References (8)

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5. A. Tiefenbach, R. Oberacker, Measurement of m→t transformation in Ce-TZP by dilatometry and impedance spectroscopy, in preparation.
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