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Volumn , Issue , 2000, Pages 279-
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Measurements of optical losses in thin films
a
a
Corning Inc
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(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE PROPAGATION;
FIBER LASERS;
OPTICAL FILMS;
OPTICAL PARAMETRIC OSCILLATORS;
SPECTROSCOPY;
THERMAL CONDUCTIVITY;
THIN FILMS;
CAVITY RING DOWN SPECTROSCOPY;
OPTICAL LOSSES;
PHOTOTHERMAL TECHNIQUES;
PROPAGATION LOSSES;
OPTICAL VARIABLES MEASUREMENT;
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EID: 0033711905
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (0)
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