CMOS with active well bias for low-power and RF/analog applications

Digest of Technical Papers-Symposium on VLSI Technology

Volumn , Issue , 2000, Pages 158-159

  Wann, Clement ^a   Harrington, Jay ^a   Mih, Rebecca ^a   Biesemans, Serge ^a   Han, Kevin ^a   Dennard, Robert ^a,b   Prigge, Odin ^a,c   Lin, Chuan ^a,c   Mahnkopf, Reinhard ^a,c   Chen, Bomy ^a  

^a IBM RESEARCH   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c INFINEON TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; LINEAR INTEGRATED CIRCUITS; MOSFET DEVICES; REACTIVE POWER;

DUAL-TRENCH ISOLATION;

CMOS INTEGRATED CIRCUITS;

EID: 0033711823     PISSN: 07431562     EISSN: None     Source Type: Journal    
DOI: 10.1109/VLSIT.2000.852808     Document Type: Article

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