|
Volumn , Issue , 2000, Pages
|
Fabrication and magnetic properties of electron beam lithography patterned arrays of single crystalline Fe(001) squares
a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
ELECTRON BEAM LITHOGRAPHY;
IRON;
KERR MAGNETOOPTICAL EFFECT;
MAGNETIC ANISOTROPY;
MAGNETIC FIELD EFFECTS;
MAGNETIC HYSTERESIS;
MAGNETIZATION;
REACTIVE ION ETCHING;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
IRON FILM;
MAGNETIC STRUCTURE;
MAGNETOOPTICAL KERR EFFECT MEASUREMENT;
REMNANT MAGNETIZATION;
MAGNETIC THICK FILMS;
|
EID: 0033711254
PISSN: 00746843
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
|
References (2)
|