Phase formation studies and structural properties of laser ablated (Pb,La)(Zr, Ti)O3-thin-films on stainless steel

Materials Research Society Symposium - Proceedings

Volumn 596, Issue , 2000, Pages 283-288

  Klarmann, R ^a   Kuhn, M ^a   Schey, B ^a   Lindner, J K N ^a   Biegel, W ^a   Stritzker, B ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DOPING (ADDITIVES); LANTHANUM; LASER ABLATION; LATTICE CONSTANTS; LEAD COMPOUNDS; PHASE TRANSITIONS; PULSED LASER APPLICATIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LATTICE MISMATCH; LEAD ZIRCONIUM TITANATE; PHASE FORMATION; PULSED LASER DEPOSITION; X RAY TRANSMISSION ELECTRON MICROSCOPY;

THIN FILMS;

EID: 0033711115     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)

1. R. Klarmann, W. Biegel, B. Wörz, J. Hemberger, B. Stritzker, Mat. Res. Soc. Symp. Proc. 541 (1999) 179.
2. D.B. Chrisey, G.K. Hubler, Pulsed Laser Deposition of Thin Films, (John Wiley & Sons Inc., New York, 1994).
3. Y. Xu, Ferroelectric Materials and Their Applications, (Elsevier Science Publishers, Amsterdam, 1991).
4. O. Auciello and R. Ramesh (eds.), Electroceramic Thin Films Part II: Device Applications, MRS Bulletin 21 (1996) 29.
5. B. Schey, W. Biegel, M. Kuhn, R. Klarmann, B. Stritzker, Appl. Surf. Sci. 127-129 (1998) 540.