Effects of grain boundary on the ferroelectric properties of selectively grown PZT thin films

Materials Research Society Symposium - Proceedings

Volumn 596, Issue , 2000, Pages 315-320

  Lee, Jang Sik ^a   Park, Eung Chul ^a   Park, Jung Ho ^a   Lee, Byung Il ^a   Joo, Seung Ki ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRODES; FERROELECTRIC MATERIALS; FILM GROWTH; GRAIN BOUNDARIES; LEAKAGE CURRENTS; NUCLEATION; OPTICAL MICROSCOPY; PLATINUM; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC PROPERTY; LEAD ZIRCONATE TITANATE;

THIN FILMS;

EID: 0033711071     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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