Micropower peak strain detection systems for remote interrogation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3990, Issue , 2000, Pages 104-109

  Hamel, Michael J ^a   Townsend, Christopher P ^a   Arms, Steven W ^a  

^a MicroStrain Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTELLIGENT MATERIALS; INTELLIGENT STRUCTURES; REMOTE SENSING; STRAIN; TRANSDUCERS;

COMMERCIAL OFF-THE-SHELF (COTS) CIRCUITS; PEAK STRAIN DETECTION SYSTEMS; RADIO FREQUENCY IDENTIFICATION (RFID) TAGS;

SENSORS;

EID: 0033708365     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)