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Volumn 216, Issue 1, 2000, Pages 249-255

On nature of centers responsible for inherent memory in ZnS:Mn thin-film electroluminescent devices

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; HYSTERESIS; IMPACT IONIZATION; MANGANESE; PHOTOCHEMICAL REACTIONS; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; ZINC SULFIDE;

EID: 0033708045     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00436-X     Document Type: Article
Times cited : (13)

References (19)
  • 11
  • 13
    • 0000003864 scopus 로고    scopus 로고
    • Optical Diagnosis of Materials and Devices for Opto-, Micro- And quantum electronics
    • in: S.V. Svechnikov, M.Ya. Valakh (Eds.)
    • N.A. Vlasenko, A.I. Beletskii, Z.L. Denisova, Ya.F. Kononets, L.I. Veligura, in: S.V. Svechnikov, M.Ya. Valakh (Eds.), Optical Diagnosis of Materials and Devices for Opto-, Micro- and quantum electronics, Proceedings of SPIE, Vol. 3359, 1998, p. 512.
    • (1998) Proceedings of SPIE , vol.3359 , pp. 512
    • Vlasenko, N.A.1    Beletskii, A.I.2    Denisova, Z.L.3    Kononets, Ya.F.4    Veligura, L.I.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.