Semiconducting chalcogenide multilayers: Structure and superconductivity

Physica B: Condensed Matter

Volumn 284-288, Issue PART I, 2000, Pages 1123-1124

  Fogel, N Ya ^a,b   Erenburg, A I ^a   Pokhila, A ^a   Bomze, Yu ^a   Sipatov, A Yu ^a   Langer, V ^b  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Multilayers; TEM; X ray diffraction; XRD

Indexed keywords

DISLOCATIONS (CRYSTALS); LEAD; MULTILAYERS; SEMICONDUCTING FILMS; SINGLE CRYSTALS; SUPERCONDUCTIVITY; TIN; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

CHALCOGENIDE MULTILAYERS;

SUPERCONDUCTING FILMS;

EID: 0033707627     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02470-9     Document Type: Article

References (4)

1. K. Murase et al., Surf. Sci. 170 (1986) 486.
2. D. Agassi, T.K. Chu, Phys. Stat. Sol. B 160 (1990) 601.
3. N.Ya. Fogel et al., Czech J. Phys. 46 (Suppl. S2) (1996) 727.
4. I.M. Dmitrenko et al., Low Temp. Phys. 19 (1992) 533.