Effect of scattering angle on energy loss near-edge structure of h-BN

Materials Transactions, JIM

Volumn 41, Issue 5, 2000, Pages 555-558

  Lee, Yoon Soo ^a   Murakami, Yasukazu ^a   Shindo, Daisuke ^a   Oikawa, Tetsuo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; MOLECULAR STRUCTURE; VARIATIONAL TECHNIQUES;

ENERGY FILTERING; ENERGY LOSS NEAR-EDGE FINE STRUCTURE (ELNES); HEXAGONAL BORON NITRIDE;

BORON COMPOUNDS;

EID: 0033707453     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.41.555     Document Type: Article

References (7)

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4. C. Tarrio and S. E. Schnatterly: Phys. Rev., B40 (1989), 7852-7859.
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6. D. Shindo and T. Oikawa: Advanced Analytical Electron Microscopy for Materials Characterization, Kyoritsu Press (in Japanese), Tokyo, (1999), pp. 75-77.
7. H. Araki, I. Tanaka and Y. Adachi: Proc. 122nd Spring Meeting of the Japan Institute of Metals, JIM, Tokyo, (1998), pp. 326.