Robustness of a multiscale scheme of feature points detection

Pattern Recognition

Volumn 33, Issue 9, 2000, Pages 1437-1453

  Fayolle, Jacques ^a   Riou, Laurence ^a   Ducottet, Christophe ^a  

^a CNRS   (France)

Author keywords

Acquisition parameter; Feature points; Local curvature; Method efficiency; Scale variation; Viewpoint; Wavelet transform

Indexed keywords

CAMERAS; FEATURE EXTRACTION; LUMINESCENCE; OBJECT RECOGNITION; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE; WAVELET TRANSFORMS;

ACQUISITION PARAMETER; FEATURE POINTS DETECTION; LOCAL CURVATURE; OBJECT ROTATION; SCALE VARIATION; VIEWPOINT;

EDGE DETECTION;

EID: 0033706829     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(99)00136-3     Document Type: Article

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