Novel approach for precise characterization of long distance mismatch of CMOS-devices

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 148-152

  Schaper, Ulrich ^a   Linnenbank, Carsten ^a   Thewes, Roland ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; INTEGRATED CIRCUIT TESTING; RESISTORS; TRANSISTORS; VOLTAGE MEASUREMENT;

LONG DISTANCE MISMATCH; PARASITIC RESISTANCE;

CMOS INTEGRATED CIRCUITS;

EID: 0033706675     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)