Analysis of alkali elements in insulators using a CAMECA IMS-61

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 1, 2000, Pages 273-277

  McKinley, J M ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALI METALS; CARRIER MOBILITY; COATING TECHNIQUES; ELECTRIC CHARGE; ELECTRIC FIELD EFFECTS; ELECTRONS; SECONDARY ION MASS SPECTROMETRY; SILICA;

ALKALI ELEMENTS; ELECTRON PENETRATION DEPTH; MAGNETIC SECTOR ANALYZERS; NEUTRALIZATION;

ELECTRIC INSULATORS;

EID: 0033706530     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. H. L. Hughes, R. D. Baxter, and B. Phillips, IEEE Trans. Nucl. Sci. NS-19, 256 (1972).
2. C. W. Magee and W. L. Harrington, Appl. Phys. Lett. 33, 193 (1978).