Demonstration of a novel multiple-valued T-gate using multiple-junction surface tunnel transistors and its application to three-valued data flip-flop

Proceedings of The International Symposium on Multiple-Valued Logic

Volumn , Issue , 2000, Pages 305-310

  Uemura, Tetsuya ^a   Baba, Toshio ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FIELD EFFECT TRANSISTORS; FLIP FLOP CIRCUITS; HETEROJUNCTIONS; INTEGRATED CIRCUIT MANUFACTURE; LOGIC CIRCUITS; LOGIC GATES;

LOGIC FUNCTION; MULTIJUNCTION SURFACE TUNNEL TRANSISTOR; T-GATE OPERATION;

MANY VALUED LOGICS;

EID: 0033706307     PISSN: 0195623X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)