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Volumn , Issue , 2000, Pages 105-108

Frequency domain response of medium voltage XLPE cable terminations and its influence on cable diagnostics

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC CABLES; FREQUENCY DOMAIN ANALYSIS; SPECTROSCOPY; VOLTAGE MEASUREMENT;

EID: 0033706296     PISSN: 01642006     EISSN: None     Source Type: Journal    
DOI: 10.1109/ELINSL.2000.845457     Document Type: Article
Times cited : (15)

References (4)
  • 1
    • 84867933150 scopus 로고    scopus 로고
    • Diagnosis of Medium Voltage XLPE Cables by High Voltage Dielectric Spectroscopy
    • P. Werelius B. Holmgren U. Gäfvert Diagnosis of Medium Voltage XLPE Cables by High Voltage Dielectric Spectroscopy ICSD ICSD Västerås Sweden 1998-June-22-25
    • (1998)
    • Werelius, P.1    Holmgren, B.2    Gäfvert, U.3
  • 2
    • 85177110219 scopus 로고
    • XLPE cable insulation diagnosis by measurement of dielectric losses as a function of frequency and voltage
    • R. Eriksson P. Werelius B. Holmgren U. Gäfvert L. Olsson XLPE cable insulation diagnosis by measurement of dielectric losses as a function of frequency and voltage CIRED CIRED Brussels 1995
    • (1995)
    • Eriksson, R.1    Werelius, P.2    Holmgren, B.3    Gäfvert, U.4    Olsson, L.5
  • 3
    • 85177113064 scopus 로고    scopus 로고
    • TU Berlin/Kungl Tekniska Högskolan
    • A. Avellan Dielectric response of medium voltage cable accessories in low frequency domain and its influence on cable diagnostics 1999 TU Berlin/Kungl Tekniska Högskolan
    • (1999)
    • Avellan, A.1
  • 4
    • 0004223515 scopus 로고
    • Dielectric relaxation in solids
    • Chelsea Dielectrics Press
    • A. K. Jonscher Dielectric relaxation in solids 1983 Chelsea Dielectrics Press
    • (1983)
    • Jonscher, A.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.