X-ray diffraction study of water confined in mesoporous MCM-41 materials over a temperature range of 223-298 K

Journal of Physical Chemistry B

Volumn 104, Issue 23, 2000, Pages 5498-5504

  Smirnov, Pavel ^a   Yamaguchi, Toshio ^a   Kittaka, Shigeharu ^b   Takahara, Shuichi ^c   Kuroda, Yasushige ^a  

^a FUKUOKA UNIVERSITY   (Japan)

^b OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

^c OKAYAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; HYDROGEN BONDS; MOLECULES; MONOLAYERS; PORE SIZE; POROUS MATERIALS; PRESSURE; SILICA; STRUCTURE (COMPOSITION); TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

CAPILLARY CONDENSED ADSORPTION CONDITIONS; RELATIVE WATER VAPOR PRESSURES; X RAY RADIAL DISTRIBUTION FUNCTIONS; X RAY SCATTERING MEASUREMENT;

WATER;

EID: 0033706012     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp994326+     Document Type: Article

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