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Volumn 581, Issue , 2000, Pages 345-350

XPS study of Pt/CexZr1-xO2/Si composite systems

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; COMPOSITION; OXIDATION; PLATINUM; POWDERS; SILICON; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033705943     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.