Self-testing of universal and fault-tolerant sets of quantum gates

Proceedings of the Annual ACM Symposium on Theory of Computing

Volumn , Issue , 2000, Pages 688-696

  Van Dam, Wim ^a   Magniez, Frédéic ^b   Mosca, Michele ^c   Santha, Miklos ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN PROCEDURE; FAULT-TOLERANT; HADAMARD GATE; HIGH PROBABILITY; PHASE ROTATION; PROGRAM TESTING; QUANTUM GATES; SPECIFIC PROPERTIES; SELF-TESTERS;

LOGIC GATES; QUANTUM ELECTRONICS; COMPUTER SYSTEMS PROGRAMMING; FAULT TOLERANT COMPUTER SYSTEMS;

COMPUTATION THEORY; LOGIC GATES;

EID: 0033704909     PISSN: 07378017     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/335305.335402     Document Type: Conference Paper

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