Moving from analysis to design: A MEMS CAD tool evolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4019, Issue , 2000, Pages 188-192

  Liateni, K ^a   Lee, Hee Jung ^a   Maher, Mary Ann ^a   Karam, J M ^a  

^a Egypt   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; COMPUTER AIDED DESIGN; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; DATABASE SYSTEMS; ELECTRIC NETWORK SYNTHESIS; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; INTELLECTUAL PROPERTY; PRODUCT DESIGN;

COMPONENT LIBRARIES;

MICROELECTROMECHANICAL DEVICES;

EID: 0033704694     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)