Characterization and analysis of CdS-CdTe junctions in thin film solar cells using various deposition techniques for CdS and CdTe

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3975, Issue , 2000, Pages

  Linam, D L ^a   Singh, V P ^a   Dils, D W ^a   McClure, J C ^a   Lush, G B ^a  

^a UNIVERSITY OF TEXAS AT EL PASO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR JUNCTIONS; THIN FILMS; TUNNEL JUNCTIONS;

CAPACITANCE-FREQUENCY CHARACTERIZATION; CAPACITANCE-VOLTAGE CHARACTERIZATION;

SOLAR CELLS;

EID: 0033704617     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)