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Volumn 44, Issue 3, 2000, Pages 144-152
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Analysis of flow-stress measurements of high-purity tungsten single crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ANALYSIS;
NUMERICAL ANALYSIS;
NUMERICAL METHODS;
PLASTIC FLOW;
RELAXATION PROCESSES;
SHEAR STRESS;
SINGLE CRYSTALS;
STRAIN HARDENING;
STRAIN RATE;
TENSILE STRESS;
THERMAL EFFECTS;
ARRHENIUS EQUATION;
CRITICAL RESOLVED SHEAR STRESS;
FLOW STRESS MEASUREMENT;
HIGH PURITY TUNGSTEN;
TUNGSTEN;
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EID: 0033704558
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-577X(00)00017-3 Document Type: Article |
Times cited : (43)
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References (40)
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