Testing microwave devices under different source impedance values - a novel technique for on-line measurement of source and device reflection coefficients

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 2, 2000, Pages 285-289

  Madonna, GianLuigi ^a,b   Ferrero, Andrea ^a,b   Pirola, Marco ^a,b   Pisani, Umberto ^b  

^a IEEE   (Italy)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEVICE CHARACTERIZATION; DEVICE UNDER TEST INPUT REFLECTION COEFFICIENT; ERROR BOX CONCEPT; MICROWAVE SOURCE PULL MEASUREMENTS; SOURCE REFLECTION COEFFICIENT; VECTOR NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; REFLECTION; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE TESTING;

REFLECTOMETERS;

EID: 0033703593     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.843065     Document Type: Article

References (13)

1. D. L. Le and F. M. Ghannouchi, "Noise measurements of microwave transistor using and uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer," IEEE Trans. Instrum. Meas., vol. 44, pp. 847-852, Aug. 1995.
2. B. Hughes and P. Tasker, "Improvements to on-wafer noise parameter measurements," in 36th ARFTG Conf. Dig., Monterey, CA, Nov. 1980, pp. 16-25.
3. F. M. Ghannouchi and R. Bosisio, "Source-pull/load-pull oscillator measurements at microwave/mm wave frequencies," IEEE Trans. Microwave Theory Tech., vol. 41, pp. 32-35, Feb. 1992.
4. D. L. Le and F. M. Ghannouchi, "Multitone characterization and design of FET resistive mixers based on combined active source-pull/load-pull techniques," IEEE Trans. Microwave Theory Tech., vol. 46, pp. 1201-1208, Sept. 1998.
5. C. Tsironis, "A novel design method of wideband power amplifier," Microwave J., pp. 303-304, May 1992.
6. G. Berghoff, E. Bergeault, B. Huyart, and L. Jallet, "Automated characterization of hf power transistor by source-pull and multiharmonic load-pull measurements based on six-port techniques," IEEE Trans. Microwave Theory Tech., vol. 46, pp. 2068-2073, Dec. 1998.
7. H. J. Eul and B. Schieck, "A generalized theory and new calibration procedures for network analyzer self-calibration," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 724-731, Apr. 1991.
8. B. Hughes, A. Ferrero, and A. Cognata, "Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices," in IEEE MTT-S Dig., Albuquerque, NM, June 1992, pp. 1019-1022.
9. D. Barataud, C. Arnaud, B. Thibaud, M. Campovecchio, J. M. Nebus, and J. P. Villotte, "Measurements of time-domain voltage/current waveforms at RF and microwave frequencies based on the use of a vector network analyzer for characterization of nonlinear devices - Application to high-efficiency power amplifiers and frequency-multipliers optimization," IEEE Trans. Instrum. Meas., vol. 47, pp. 1259-1264, Oct. 1998.
10. G. P. Bava, U. Pisani, and V. Pozzolo, '"Source pull' technique at microwave frequencies," Electron. Lett., vol. 20, no. 4, pp. 152-154, Feb. 1984.
11. I. Hecht, "Improved error-correction technique for large-signal load-pull measurements," IEEE Trans. Microwave Theory Tech., vol. MTT-35, pp. 1060-1062, Nov. 1987.
12. R. A. Speciale, "A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors," IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1100-1115, Dec. 1977.
13. R. A. Speciale, "Multiport network analyzers: meeting the design need," Microwave J., pp. 67-89, June 1980.