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Volumn 4031, Issue , 2000, Pages 185-194

Design and implementation of a new UHV threshold cathode test facility

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELDS; ELECTRON MULTIPLIERS; MATERIALS TESTING; MICROWAVE DEVICES; PARTIAL PRESSURE; TEST FACILITIES; VACUUM TECHNOLOGY;

EID: 0033703384     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (14)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.