Measurements of the sub-pixel sensitivity for a backside-illuminated CCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3965, Issue , 2000, Pages 289-297

  Piterman, Albert ^a   Ninkov, Zoran ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; ELECTRIC FILTERS; LIGHT SOURCES;

BACKSIDE ILLUMINATION; PIXEL SENSITIVITY;

CHARGE COUPLED DEVICES;

EID: 0033703250     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)