Angle metrology of dispersion prisms

CIRP Annals - Manufacturing Technology

Volumn 49, Issue 1, 2000, Pages 415-418

  Estler, W T ^a   Queen, Y H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CALIBRATION; ELECTROMAGNETIC DISPERSION; OPTICAL COLLIMATORS; REFRACTIVE INDEX;

DISPERSION PRISMS;

PRISMS;

EID: 0033702074     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)62978-3     Document Type: Article

References (9)

1. Nussbaum, A. and Phillips, R.A., 1976, "Contemporary Optics for Scientists and Engineers," Prentice-Hall, NY.
2. Hecht, E. and Zajac, A., 1973, "Optics" Addison-Wesley, Reading, MA.
3. Estler, W. T., and Queen, Y. H., 1993, "An Advanced Angle Metrology System", CIRP Annals, Vol. 41/1, p. 573.
4. Estler, W. T., Queen, Y. H., Gilsinn, D., and Pieczulewski, D., 1991, "Advanced Angle Metrology at the National Institute of Standards and Technology," Proc. of the ASPE 1991 Annual Conference.
5. Evans, C. J., Hocken, R. J., and Estler, W. T., 1996, "Self-Calibration: reversal, redundancy, error separation, and 'absolute testing'," CIRP Annals Vol. 45/2, p. 791.
6. Estler, W. T., 1998, "Uncertainty Analysis for Angle Calibrations Using Circle Closure," J. Res. Natl. Inst. Stand. Technol. 103, 141-151.
7. Rao, S. M., 1997, "Method for measurement of the angles of an equilateral (60-deg) prism," Opt. Eng. 36(5) 1508-1509.
8. g versus λ for fused silica can be found at: www.layertech.de/sio2-uv.htm (Layertec GmbH., Mellingen, Germany) and www.crystran.co.uk/sio2- ri.htm (CRYSTRAN Ltd., Dorset, UK).
9. ISO, 1993, Guide to the Expression of Uncertainty in Measurement, International Organization for Standardization, Geneva, Switzerland.