Measurement of optical gain and Fermi level separation in semiconductor structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3944 (I), Issue , 2000, Pages 201-208

  Thomson, J D ^a   Summers, H D ^a   Hulyer, P J ^a   Smowton, P M ^a   Blood, P ^a  

^a UNIVERSITY OF WALES   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FERMI LEVEL; LIGHT POLARIZATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SPONTANEOUS EMISSION;

FERMI LEVEL SEPARATION; OPTICAL GAIN MEASUREMENT;

QUANTUM WELL LASERS;

EID: 0033701194     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.391422     Document Type: Conference Paper

References (15)