T-CAT, a new Thermal Camera Acuity Tester

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4030, Issue , 2000, Pages 232-238

  Valeton, J Mathew ^a   Bijl, Piet ^a   Agterhuis, Evert ^a   Kriekaard, Sjaak ^a  

^a TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; IMAGE SENSORS; INFRARED IMAGING; OPTICAL RESOLVING POWER; OPTICAL SENSORS;

MINIMUM RESOLVABLE TEMPERATURE DIFFERENCE (MRTD) METHOD; THERMAL CAMERA ACUITY TESTERS; TRIANGLE ORIENTATION DISCRIMINATION (TOD) METHOD;

IMAGING SYSTEMS;

EID: 0033699697     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)