Compensation of nonlinear self-focusing in high-power lasers

IEEE Journal of Quantum Electronics

Volumn 36, Issue 6, 2000, Pages 687-691

  Roth, Ulrich ^b   Loewenthal, F ^b   Tommasini, R ^c   Balmer, J E ^b   Weber, H P ^a,b  

^a IEEE

^b UNIVERSITY OF BERN   (Switzerland)

^c MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PROPAGATION; NONLINEAR SELF FOCUSING EFFECT; PHASE DIFFERENCE;

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE POLARIZATION; INTEGRATION; NEODYMIUM LASERS; PHASE MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE;

NONLINEAR OPTICS;

EID: 0033699334     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.845724     Document Type: Article

References (10)

1. D. C. Brown, High-Peak-Power Nd : Glass Laser Systems, ser. Springer Series in Optical Sciences. Berlin, Germany: Springer-Verlag, 1981, vol. 25.
2. W. Koechner, Solid-State Laser Engineering, ser. Springer Series in Optical Sciences. Berlin, Germany: Springer-Verlag, 1996.
3. E. S. Bliss, D. R. Speck, J. F. Holzrichter, J. H. Erkkila, and A. J. Glass, "Propagation of a high intensity laser pulse with small-scale intensity modulation," Appl. Phys. Lett., vol. 25, pp. 448-450, 1974.
4. J. T. Hunt, J. A. Glaze, W. W. Simmons, and P. A. Renard, "Suppression of self-focusing through low-pass spatial filtering and relay imaging," Appl. Opt., vol. 17, no. 13, pp. 2053-2057, 1978.
5. R. H. Lehmberg, J. Reintjes, and R. C. Eckardt, "Negative nonlinear susceptibility of cesium vapor around 1.06 μm," Phys. Rev. A, vol. 13, pp. 1095-1103, 1976.
6. M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, "Dispersion of bound electronic nonlinear refraction in solids," IEEE J. Quantum Electron., vol. 27, pp. 1296-1309, 1991.
7. O. A. Konoplev and D. D. Meyerhofer, "Cancelation of B-integral accumulation for CPA lasers," IEEE J. Select. Topics Quantum Electron., vol. 4, pp. 459-469, 1998.
8. [81 E. W. Van Stryland, H. Vanherzeele, M. A. Woodall, M. J. Soileau, A. L. Smirl, S. Guha, and T. F. Boggess, "Two photon absorption, nonlinear refraction, and optical limiting in semiconductors," Opt. Eng., vol. 24, pp. 613-623, 1985.
9. J. W. Goodman, Introduction to Fourier Optics. New York, NY: McGraw-Hill, 1996.
10. F. Loewenthal, R. Tommasini, and J. E. Balmer, "Single-shot measurement of laser-induced damage thresholds of thin film coatings," Opt. Commun., vol. 152, pp. 168-174, 1998.