Identification of 2D boundaries from 3D atom probe data, and spatial correlation of atomic distributions with interfaces

Materials Research Society Symposium - Proceedings

Volumn 578, Issue , 2000, Pages 395-400

  Hellman, O C ^a   Vandenbroucke, J A ^b   Rusing J ^a   Isheim, D ^a   Seidman, D N ^a  

^a Northwestern University   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; COMPOSITION; COPPER ALLOYS; CRYSTAL DEFECTS; INTERFACES (MATERIALS); MAGNESIA; METALLOGRAPHIC MICROSTRUCTURE; PROBES; SEGREGATION (METALLOGRAPHY);

ATOMIC DISTRIBUTION; HETEROPHASE BOUNDARIES; THREE DIMENSIONAL ATOM PROBE; TWO DIMENSIONAL BOUNDARIES;

GRAIN BOUNDARIES;

EID: 0033699116     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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