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Volumn 3, Issue , 2000, Pages III-766-III-769

Repeater insertion in deep sub-micron CMOS: Ramp-based analytical model and placement sensitivity analysis

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC INVERTERS; MATHEMATICAL MODELS; SENSITIVITY ANALYSIS;

EID: 0033699061     PISSN: 02714310     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISCAS.2000.856173     Document Type: Article
Times cited : (33)

References (10)
  • 1
    • 0003479594 scopus 로고
    • Circuits, Interconnections, and Packaging for VLSI
    • Addison-Wesley MA, Reading
    • H. B. Bakoglu Circuits, Interconnections, and Packaging for VLSI 1990 Addison-Wesley MA, Reading
    • (1990)
    • Bakoglu, H.B.1
  • 3
    • 0027259927 scopus 로고
    • Parallel regeneration of interconnections in VLSI & ULSI circuits
    • M. Nekili Y. Savaria Parallel regeneration of interconnections in VLSI & ULSI circuits Proc. IEEE Int. Symp. Circuits and Systems 2023 2026 Proc. IEEE Int. Symp. Circuits and Systems 1993-May
    • (1993) , pp. 2023-2026
    • Nekili, M.1    Savaria, Y.2
  • 5
    • 0025415048 scopus 로고
    • Alpha-Power Law MOSFET model and its applications to CMOS inverter delay and other formulas
    • T. Sakurai A. R. Newton Alpha-Power Law MOSFET model and its applications to CMOS inverter delay and other formulas IEEE JSSC 25 2 584 594 Apr. 1990
    • (1990) IEEE JSSC , vol.25 , Issue.2 , pp. 584-594
    • Sakurai, T.1    Newton, A.R.2
  • 6
    • 0023310827 scopus 로고
    • The impact of intrinsic series resistance on MOSFET Scaling
    • K. K. Ng W. T. Lynch The impact of intrinsic series resistance on MOSFET Scaling IEEE. Tran. Electron Devices ED-34 503 511 Mar. 1987
    • (1987) IEEE. Tran. Electron Devices , vol.ED-34 , pp. 503-511
    • Ng, K.K.1    Lynch, W.T.2
  • 7
    • 84937744575 scopus 로고
    • Modeling and simulation of insulated gate field-effect transistor switching circuits
    • H. Shichman D. A. Hodges Modeling and simulation of insulated gate field-effect transistor switching circuits IEEE J.Solid-State Circuits SC-3 285 289 Sept. 1968
    • (1968) IEEE J.Solid-State Circuits , vol.SC-3 , pp. 285-289
    • Shichman, H.1    Hodges, D.A.2
  • 9
    • 85177142825 scopus 로고    scopus 로고
    • Getting to the bottom of deep submicron II: A global paradigm
    • D. Sylvester K. Keutzer Getting to the bottom of deep submicron II: A global paradigm Proceedings of ISPD'99 193 200 Proceedings of ISPD'99
    • Sylvester, D.1    Keutzer, K.2
  • 10
    • 84882356591 scopus 로고
    • Optimal Methods of driving interconnections in VLSI Circuits
    • M. Nekili Y. Savaria Optimal Methods of driving interconnections in VLSI Circuits Proc.IEEE Int. Symp. Circuits and Systems 21 23 Proc.IEEE Int. Symp. Circuits and Systems 1992-May
    • (1992) , pp. 21-23
    • Nekili, M.1    Savaria, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.