Fabrication and testing of 1,000 V-60 A 4H-SiC MPS diodes in an inductive half-bridge circuit

Materials Science Forum

Volumn 338, Issue , 2000, Pages

  Tone, K ^a   Zhao, J H ^a   Weiner, M ^a   Pan, M ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SWITCHING;

INDUCTIVE HALF-BRIDGE SWITCHING;

SILICON CARBIDE;

EID: 0033698831     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)