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Volumn , Issue , 2000, Pages 2-3
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VLSI Symposium and silicon technology: A twenty year perspective
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Author keywords
[No Author keywords available]
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Indexed keywords
PRODUCT DEVELOPMENT;
SILICON;
TECHNOLOGICAL FORECASTING;
SCALING LIMITS;
VLSI CIRCUITS;
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EID: 0033698756
PISSN: 07431562
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (3)
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