Order parameters for minimax entropy distributions: When does high level knowledge help?

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 2000, Pages 558-565

  Yuille, A L ^a   Coughlan, James ^a   Zhu, Song Chun ^b   Wu, Yingnian ^b,c  

^a SMITH KETTLEWELL EYE RESEARCH INSTITUTE   (United States)

^b OHIO STATE UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; IMAGE SEGMENTATION; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; OBJECT RECOGNITION; OPTIMIZATION; PROBABILITY DISTRIBUTIONS;

BAYESIAN INFERENCE; HIGH LEVEL KNOWLEDGE; MINIMAX ENTROPY DISTRIBUTIONS; ORDER PARAMETERS;

COMPUTER VISION;

EID: 0033698068     PISSN: 10636919     EISSN: None     Source Type: Journal    
DOI: 10.1109/CVPR.2000.855869     Document Type: Conference Paper

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