Polarized monochromatic X-ray beam extracted from laboratory electron impact source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4012, Issue , 2000, Pages 414-421

  Koike, Tetsuji ^a   Hayashida, Kiyoshi ^a   Hashimoto, Yasuaki ^a   Akutsu, Daisuke ^a   Ohtani, Masayuki ^a   Tsunemi, Hiroshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON IRRADIATION; LIGHT POLARIZATION; MONOCHROMATORS; OPTICAL VARIABLES MEASUREMENT; X RAY SPECTROMETERS;

CRYSTAL MONOCHROMOMETERS; DOUBLE CRYSTAL SPECTROMETERS; X RAY GENERATORS;

X RAYS;

EID: 0033697370     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)