|
Volumn , Issue , 2000, Pages 573-576
|
New approach to fully integrated CMOS LC-oscillators with a very large tuning range
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CMOS INTEGRATED CIRCUITS;
FREQUENCIES;
INTEGRATED CIRCUIT MANUFACTURE;
STATISTICAL METHODS;
THERMAL NOISE;
STANDARD DEVIATION;
THERMAL DEVICE NOISE;
TUNING RANGE;
OSCILLATORS (ELECTRONIC);
|
EID: 0033697198
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (41)
|
References (14)
|