Laser-ablated thin films of infinite-layer compounds and related materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4058, Issue , 2000, Pages 141-152

  Markert, John T ^a   Messina, Troy C ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC SHIELDING; LASER ABLATION; OXIDE SUPERCONDUCTORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

LASER FLUENCE; OXYGEN PRESSURE; STRONTIUM TITANATE;

THIN FILMS;

EID: 0033695857     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)