Materials and techniques for controllable microwave surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4073, Issue , 2000, Pages 109-120

  Barnes, Alan ^a   Ford, Kenneth L ^a   Wright, Peter V ^a   Chambers, Barry ^a   Smith, Christopher D ^a   Thompson, Denise A ^a   Pavri, Francis ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AGENTS; CYCLIC VOLTAMMETRY; ELECTRIC FIELD EFFECTS; ELECTRIC IMPEDANCE; ELECTRIC VARIABLES CONTROL; MICROWAVE MEASUREMENT; MICROWAVES; NANOSTRUCTURED MATERIALS; POLYELECTROLYTES; POLYPYRROLES; REDOX REACTIONS; REFLECTION;

CONTROLLABLE MICROWAVE SURFACES; CONTROLLABLE RESISTANCE; MICROWAVE IMPEDANCE; POLYANILINE TETRAFLUOROBORATE; REDOX ACTIVE SWITCHING AGENT;

INTELLIGENT MATERIALS;

EID: 0033695461     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)