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Volumn 3, Issue , 2000, Pages 1467-1470

Measurement based nonlinear modeling of spectral regrowth

Author keywords

[No Author keywords available]

Indexed keywords

NONLINEAR VECTORIAL NETWORK ANALYZER; SPECTRAL REGROWTH;

EID: 0033694488     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (5)

References (6)
  • 2
    • 79952626586 scopus 로고    scopus 로고
    • Measuring the characteristics of modulated Nonlinear Devices
    • Anaheim,USA, June
    • Y. Rolain, W. Van Moer and P. Vael, "Measuring the characteristics of modulated Nonlinear Devices", 53rdARFTG Conference, Anaheim,USA, June 1999, pp. 89-97.
    • (1999) 53rdARFTG Conference , pp. 89-97
    • Rolain, Y.1    Van Moer, W.2    Vael, P.3
  • 3
    • 0028748993 scopus 로고
    • VIOMAP, the sparameters equivalent for weakly nonlinear rf and microwave devices
    • Dec.
    • F. Verbeyst and M. Vanden Bossche, "VIOMAP, the Sparameters Equivalent for Weakly Nonlinear RF and Microwave Devices", Transactions of Micmwave Theory and Techniques, Vol. 42,No. 12, Dec. 1994, pp. 2531-2535.
    • (1994) Transactions of Micmwave Theory and Techniques , vol.42 , Issue.12 , pp. 2531-2535
    • Verbeyst, F.1    Vanden Bossche, M.2
  • 4
    • 0027989972 scopus 로고
    • Calibrated vectorial nonlinear network analyser
    • San-Diego, USA
    • T. Van den Broeck, J. Verspecht, "Calibrated Vectorial Nonlinear Network Analyser", IEEE-MT7-S. San-Diego, USA, 1994, pp. 1069-1072.
    • (1994) IEEE-MT7-S , pp. 1069-1072
    • Van Den Broeck, T.1    Verspecht, J.2
  • 5
    • 0033677940 scopus 로고    scopus 로고
    • An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer
    • Boston, USA, June
    • W. Van Moer, Y. Rolain and J. Schoukens, "An Automatic Harmonic Selection Scheme for Measurements and Calibration with the Nonlinear Vectorial Network Analyser', Proceeding.7 of the Microwave Theory and Techniqum Conference, Boston, USA, June 2000
    • (2000) Proceeding.7 of the Microwave Theory and Techniqum Conference
    • Van Moer, W.1    Rolain, Y.2    Schoukens, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.