Formation and characterization of single crystal Ni2MnGa thin films

Materials Research Society Symposium - Proceedings

Volumn 604, Issue , 2000, Pages 297-302

  Dong, J W ^a   Chen, L C ^a   McKernan, S ^a   Xie, J Q ^a   Figus, M T ^a   James, R D ^a   Palmstrom, C J ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETOMETERS; MARTENSITIC TRANSFORMATIONS; MOLECULAR BEAM EPITAXY; NICKEL ALLOYS; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; SQUIDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CURIE TEMPERATURE; NICKEL MANGANESE GALLIUM ALLOY; VIBRATING SAMPLE MAGNETOMETER;

THIN FILMS;

EID: 0033693886     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)